White Paper Overview

The monitoring and testing of a DAC signal chain are critical considerations for open-loop applications. Errors in a DAC signal chain, including DAC intrinsic errors that vary depending on the system, can significantly disrupt the customer design-in experience.

In this whitepaper from Analog Devices, learn about the AD5679/74 family, which offers 2x higher channel density than current 8-channel parts in the same 4x4 LFCSP footprint. Readers will also come to learn how this family reduces the number of coupling capacitors needed and generally simplifies the layout requirements overall, allowing for a simplified approach to DAC signal testing in general.